NC-AFM'98 Proceedings of the First International Workshop on Noncontact Atomic Force MicroscopyMORITA, Seizo; TSUKADA, Masaru.Applied surface science. 1999, Vol 140, Num 3-4, issn 0169-4332, 204 p.Conference Proceedings

Semiconductor acousto-electric potential detection using a force microscopeKIKUKAWA, A; HOSAKA, S.Applied surface science. 1999, Vol 140, Num 3-4, pp 394-399, issn 0169-4332Conference Paper

Theory for the effect of the tip-surface interaction potential on atomic resolution in forced vibration system of noncontact AFMSASAKI, N; TSUKADA, M.Applied surface science. 1999, Vol 140, Num 3-4, pp 339-343, issn 0169-4332Conference Paper

Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopyMORITA, S; SUGAWARA, Y.Applied surface science. 1999, Vol 140, Num 3-4, pp 406-410, issn 0169-4332Conference Paper

Tip cleaning and sharpening processes for noncontact atomic force microscope in ultrahigh vacuumTOMITORI, M; ARAI, T.Applied surface science. 1999, Vol 140, Num 3-4, pp 432-438, issn 0169-4332Conference Paper

Three-dimensional scanning force/tunneling spectroscopy at room temperature : Non-contact AFMSUGIMOTO, Yoshiaki; UEDA, Keiichi; ABE, Masayuki et al.Journal of physics. Condensed matter (Print). 2012, Vol 24, Num 8, issn 0953-8984, 084008.1-084008.7Article

Non-contact AFM observation of the (√3 x √3) to (3 x 3) phase transition on Sn/Ge(1 11) and Sn/Si(1 11) surfacesYI, Insook; NISHI, Ryuji; SUGIMOTO, Yoshiaki et al.Applied surface science. 2007, Vol 253, Num 6, pp 3072-3076, issn 0169-4332, 5 p.Article

Study on topographic images of Sn/Si(111)-(√3 × √3)R30° surface by non-contact AFMYI, Insook; SUGIMOTO, Yoshiaki; NISHI, Ryuji et al.Surface science. 2006, Vol 600, Num 17, pp 3382-3387, issn 0039-6028, 6 p.Article

Microscopic contact charging and dissipationMORITA, Seizo; SUGAWARA, Yasuhiro.Thin solid films. 2001, Vol 393, Num 1-2, pp 310-318, issn 0040-6090Conference Paper

Observation of single- and double-stranded DNA using non-contact atomic force microscopyMAEDA, Y; MATSUMOTO, T; KAWAI, T et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 400-405, issn 0169-4332Conference Paper

The electrostatic contribution to the long-range interactions between tungsten and oxide surfaces under ultrahigh vacuumSOUNILHAC, S; BARTHEL, E; CREUZET, F et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 411-414, issn 0169-4332Conference Paper

Contrast inversion in dynamic force microscopy on silicon(111) 7 × 7 and gold(111) 23 × √3MOLITOR, S; GÜTHNER, P; BERGHAUS, T et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 276-280, issn 0169-4332Conference Paper

High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope techniqueKITAMURA, S; SUZUKI, K; IWATSUKI, M et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 265-270, issn 0169-4332Conference Paper

Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force MicroscopySUGIMOTO, Yoshiaki; POU, Pablo; DISTANCE, Oscar et al.Science (Washington, D.C.). 2008, Vol 322, Num 5900, pp 413-417, issn 0036-8075, 5 p.Article

Contrast mechanism in non-contact SFM imaging of ionic surfacesLIVSHITS, A. I; SHLUGER, A. L; ROHL, A. L et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 327-332, issn 0169-4332Conference Paper

Dynamic scanning force microscopy at low temperatures on a van der Waals surface : graphite (0001)ALLERS, W; SCHWARZ, A; SCHWARZ, U. D et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 247-252, issn 0169-4332Conference Paper

Chemical interactions in noncontact AFM on semiconductor surfaces : Si(111), Si(100) and GaAs(110)PEREZ, R; STICH, I; PAYNE, M. C et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 320-326, issn 0169-4332Conference Paper

Apparent contrast of molecularly thin films of water at ionic crystal surfacesMIURA, K; YAMADA, T; ISHIKAWA, M et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 415-421, issn 0169-4332Conference Paper

Imitation of non-contact mode while scanning in the presence of an electric double layer?SOKOLOV, I. Yu; HENDERSON, G. S; WICKS, F. J et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 422-427, issn 0169-4332Conference Paper

Calculation of the optimal imaging parameters for frequency modulation atomic force microscopyGIESSIBL, F. J; BIELEFELDT, H; HEMBACHER, S et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 352-357, issn 0169-4332Conference Paper

Force spectroscopy in noncontact modeSOKOLOV, I. Yu; HENDERSON, G. S; WICKS, F. J et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 358-361, issn 0169-4332Conference Paper

Pseudo-non-contact AFM imaging?SOKOLOV, I. Yu; HENDERSON, G. S; WICKS, F. J et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 362-365, issn 0169-4332Conference Paper

The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscopeORISAKA, S; MINOBE, T; UCHIHASHI, T et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 243-246, issn 0169-4332Conference Paper

Imaging of atomic-scale structure of oxide surfaces and adsorbed molecules by noncontact atomic force microscopyFUKUI, K.-I; ONISHI, H; IWASAWA, Y et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 259-264, issn 0169-4332Conference Paper

Investigations of C₆₀ molecules deposited on Si(111) by noncontact atomic force microscopyKOBAYASHI, K; YAMADA, H; HORIUCHI, T et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 281-286, issn 0169-4332Conference Paper